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Potentiometric-Scanning Ion Conductance Microscopy
Cody Leasor
Potentiometric-Scanning Ion Conductance Microscopy (P-SICM) is a rising sub-class of scanning ion conductance microscopy (SICM) that allows for the simultaneous collection of topography and local apparent conductance. In the Bakergrp, this technique began with past group members such as, Chiao-Chen who started by making single-point measurements (Chen, C. C.; Zhou, Y.; Morris, C. A.; Hou,…
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Our New COMSOL Simulation Horsepower
Yunong Wang
For electrochemists doing research with scanning probe techniques, COMSOL modeling plays a significant role in instructing experiment design, estimating imaging results affected by pipette geometric, and validating electrochemical phenomena observed. Recently, Baker group has purchased a new server for more efficient COMSOL simulation. The Dell PowerEdge server is specified with 24-core AMD EYPC processor, and…
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