Potentiometric-Scanning Ion Conductance Microscopy (P-SICM) is a rising sub-class of scanning ion conductance microscopy (SICM) that allows for the simultaneous collection of topography and local apparent conductance. In the Bakergrp, this technique began with past group members such as, Chiao-Chen who started by making single-point measurements (Chen, C. C.; Zhou, Y.; Morris, C. A.; Hou, […]

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